Parallel Events Programme
Pathways and Challenges of reliability testing for perovskite based photovoltaic devices
Jointly organised with NPL – NREL
Organisers – chairs: George Koutsourakis1, Michael Owen-Bellini2
1National Physical Laboratory Hampton Road, Teddington, Middlesex, TW11 0LW, United Kingdom
2National Renewable Energy Laboratory (NREL), 15013 Denver West Parkway Golden, CO 80401 USA
Perovskite based photovoltaic (PV) devices have demonstrated high efficiencies and scalability potential, but final packaged products have not yet met reliability requirements similar to conventional technologies (Si, CdTe). PV devices based on metal halide perovskites are typically more sensitive to environmental conditions such as moisture and oxygen. Improvement of intrinsic stability of the PV device and highly efficient and reliable encapsulation schemes can lead to commercialisation and wider adoption of this technology. Nevertheless, in order for such products to enter the market and for investors to have confidence in them , they have to pass appropriate reliability standards. In this session, a diverse panel of experts from the perovskite PV industry, academia, test labs and investment sector will interact with each other and the audience to discuss the following points:
- Are current thin film or Si reliability standards appropriate for perovskite PV products?
- Are other testing procedures necessary?
- What do investors need to see in order to have confidence in perovskite PV products?
The panel will consist of
- Laura Schelhas, National Renewable Energy Laboratory (NREL), USA
- Theodoros Makris, TÜV Rheinland Solar GmbH, Germany
- Mark Khenkin, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Germany
- Chris Case, Oxford PV, United Kingdom
- Jan Muller, Statkraft, Norway/United Kingdom
The event is estimated to last approximately 1 hour and 30 minutes
This information will be updated constantly.